The X-ray diffraction measurements were carried out with a Bruker D8 Discover Diffractometer (Bruker AXS), with an EIGER-2 detector, and a copper source (Cu Kα λ = 1.5406 Å, 40 kV, 40 mA). The powder samples were mounted onto an optical glass sample holder and analyzed from 7-100° 2θ with its recorded intensity normalized to (0,100). 

Transmission electron microscopy (TEM) was performed with a 2100F system (JEOL) at a voltage of 200 kV. To prepare the samples a copper grid coated with lacey carbon was used as the sample, and the powder was dispersed in ethanol via ultrasonic bath and then dried on the copper grid drop by drop.